Junjun Gu

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Peak current is one of the important considerations for circuit design and testing in the deep sub-micron technology. In a synchronous finite state machine (FSM), it is observed that the peak current happens at the moment of state transitions and it has a strong correlation with the maximum number of state registers switching in the same direction(More)
— Dual-V t technology is effective in leakage reduction and has been implemented in industry EDA tools. However, on-chip temperature is regarded as uniformly distributed over the chip, with a pre-assumed value. This assumption does not hold for designs in the deep sub-micron deomain as on-chip temperature variation becomes more and more significant. As a(More)
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