Learn More
In this paper, we present a BIST technique that measures the RMS value of a Gaussian distribution period jitter. In the proposed approach, the signal under test is delayed by two different delay values and the probabilities it leads the two delayed signals are measured. The RMS jitter can then be derived from the probabilities and the delay values. Behavior(More)
In this paper, we present an infrastructure IP core to facilitate on-chip clock jitter measurement. In the proposed approach, the clock signal under test is delayed by two different delay values and the probabilities it leads the two delayed versions are measured. The RMS period jitter value can then be derived from the probabilities and the delay(More)
  • 1