Jos J. Dohmen

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E Jan W ter Maten , Piotr A Putek, Michael Günther, Roland Pulch, Caren Tischendorf, Christian Strohm, Wim Schoenmaker, Peter Meuris, Bart De Smedt, Peter Benner, Lihong Feng, Nicodemus Banagaaya, Yao Yue, Rick Janssen, Jos J Dohmen, Bratislav Tasić, Frederik Deleu, Renaud Gillon, Aarnout Wieers, Hans-Georg Brachtendorf, Kai Bittner, Tomáš Kratochvíl, Jiří(More)
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to the nominal, “golden”, design of an electronic circuit. By fault simulation we simulate all situations: a huge number of new connections and each with many different values, up to the regime of large deviations, for the newly added element. We(More)
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