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In this paper, we present a method to miniaturize electromagnetic band-gap (EBG) structure. EBG is used to suppress noise occurred as tons of switching devices switch on and off simultaneously. In the proposed model, slits exist on both power and ground planes of power distribution network (PDN), which is called 3-D EBG due to the geometric configuration.(More)
—An efficient measurement methodology is proposed to construct the scattering parameters of a multi-port device using a four-port vector network analyzer (VNA) without the external un-terminated ports. By using the four-port VNA, the reflected waves from the un-terminated ports could be minimized. The proposed method significantly enhances the accuracy of(More)
Probe card is an interface to test the operation of fabricated semiconductor wafer. It connects the test/measurement device to semiconductor wafer by redistributing thousands of signal routes in an appropriate way. In this paper, we measure and simulate the high-frequency transfer characteristics of a MEMs type probe card. By comparison of the simulated and(More)
In this paper, we propose an equivalent electrical circuit model of a 40-pin board-to-FPC (flexible printed cable) connector for high frequency signal transfer characteristics. We fabricated an interface board to be fitted in FPC connector (0.5 mm pitch), which enables probing to measure signal transfer characteristics of 40-pin FPC connector. When(More)
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