Jong-Hwan Oh

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In this paper, we propose a Mura detection method in LCM panel using wavelet transform. Generally, the defect in LCM is so burred that the Mura boundary between defect and background is not clear. To detect and recognize exactly the boundary part of the defect, discrete wavelet transform is used. Then considering the relationship of wavelet coefficients,(More)
The thin film transistor liquid crystal display (TFT- LCD) image has non-uniform brightness, which is the major difficulty in finding the defect region called Mura. To facilitate Mura segmentation, globally widely varying background signal has to be flattened and Mura signal must be enlarged. In this paper, Mura signal magnification and background signal(More)
The thin film transistor liquid crystal display (TFT-LCD) image has nonuniform brightness, which is a major difficulty in finding the Mura defect region. To facilitate Mura segmentation, globally widely varying background signal must be flattened and then Mura signal must be enhanced. In this paper, Mura signal enhancement and background-signalflattening(More)
The needs of automated inspection system are grown for the flat panel displays (FPD). However, it is so difficult to detect the defects on the surface of FPD due to non-uniform intensity distribution through the whole panel. Especially, curve-type defects such as micro sized thread and scratch are too difficult to detect with the conventional methods. In(More)
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