Jonathan B. Scott

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We describe a new RF and microwave power sensor monolithic microwave integrated circuit design. The circuit incorporates a number of advances over existing designs. These include a III-V epitaxial structure optimized for sensitivity, the figure-of-merit applicable to the optimization, a mechanism for in-built detection of load ageing and damage to extend(More)
We measure output waveshape and rise time of two high-speed digital circuits on wafer using a 50-GHz prototype of a new instrument. The instrument uses vector error correction to deembed the component under test like a network analyzer, but reads out in the time domain after the fashion of an equivalent-time oscilloscope. With the calibration plane of the(More)
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