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One of the major issues faced by the semiconductor industry today is that of reducing chip yields. As the process technologies have scaled to smaller feature sizes, chip yields have dropped to around 50% or less. This figure is expected to decrease even further in future technologies. To attack this growing problem, we develop four yield-aware(More)
Research assessment in the UK has evolved over a quarter of a century from a loosely structured, peer-review based process to one with a well understood data portfolio and assessment methodology. After 2008, the assessment process will shift again, to the use of indicators based largely on publication and citation data. These indicators will in part follow(More)
The network of international co-authorship relations has been dominated by certain European nations and the USA, but this network is rapidly expanding at the global level. Between 40 and 50 countries appear in the center of the international network in 2011, and almost all (201) nations are nowadays involved in international collaboration. In this brief(More)
Many applications in materials science, life science and process control would benefit from atomic force microscopes (AFM) with higher scan speeds. To achieve this, the performance of many of the AFM components has to be increased. In this work, we focus on the cantilever sensor, the scanning unit and the data acquisition. We manufactured 10 microm wide(More)
File systems have (at least) two undesirable characteristics: both the addressing model and the consistency semantics differ from those of memory, leading to a change in programming model at the storage boundary. Main memory is a single flat space of pages with a simple durability (persistence) model: all or nothing. File content durability is a complex(More)