Jon Barth

Learn More
This paper discusses the previously unexplored initial front rise differences between Real HBM, TLP and HBM tester waveshapes. The dV/dt of the HBM test pulse amplitude below 2% has been shown to affect the high current immunity of Snapback type ESD protection circuits, and should replace the present time specification for a high voltage HBM pulse to rise(More)
– Parameters associated with an observed variation in CDM ESD waveforms are shown to be pogo pin diameter, pogo pin length, ground plane size, and distance between ground plane and charge plate. The effects on resulting discharge waveforms and solutions for improvement of existing CDM standards will be discussed.
  • 1