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This paper describes a constant impedance transmission line pulse system with new measurement capabilities and improved accuracy. The paper enforces a broader look at transmission line pulse (TLP) data, beyond the – curves. Accurate TLP measurements and actual TLP/HBM device data are used to demonstrate effects and HBM/TLP correlation and miscorrelation.(More)
In this work, we demonstrate that both capacitance and inductance must be the central parameters associated with the Charged Device Model (CDM) waveform verification modules. We also propose a change from the previously used FR-4 dielectric material substrate to a more stable Alumina. This improves waveform repeatability and will lead to better correlation(More)
The IC industry continues to find ways to improve the ability to correlate the electrical failure signature of devices with the physical failure location using different techniques. The purpose of this work is to show that improved transmission line pulse (TLP) testing technique of ESD (ElectroStatic Discharge) protection structures can provide accurate(More)
This paper discusses the previously unexplored initial front rise differences between Real HBM, TLP and HBM tester waveshapes. The dV/dt of the HBM test pulse amplitude below 2% has been shown to affect the high current immunity of Snapback type ESD protection circuits, and should replace the present time specification for a high voltage HBM pulse to rise(More)
The integrated circuit (IC) industry has been using transmission-line pulse (TLP) testing to characterize on-chip electrostatic discharge (ESD) protection structures since 1985. This TLP ESD testing technique was introduced by Maloney and Khurana as a new electrical analysis tool to test the many single elements used as ESD protection structures. Since(More)
Parameters associated with an observed variation in CDM ESD waveforms are shown to be pogo pin diameter, pogo pin length, ground plane size, and distance between ground plane and charge plate. The effects on resulting discharge waveforms and solutions for improvement of existing CDM standards will be discussed.
Until recently, in situ measurements in a network of radiation-measuring sites at the Deutscher Wetterdienst could only be started if all components had been put up in an instrumentation shelter and the detector had been cooled for ∼6 h. Within a project on partial automation of radioactivity monitoring, it has now become possible to permanently equip the(More)
This paper presents electrical methods used to measure and analyze the operation of ESD protection circuits built into every lead of an Integrated Circuit (IC). These circuits clamp voltage threats to sensitive core circuits which enter through each connections to the outside world. Representative samples of each IC are tested for their ESD immunity level(More)
Existing Charged Device Model standards have relied exclusively on time domain specifications; but devices discharge in the CDM resonant circuit at different frequencies. Accurate measurements of CDM discharge parameters require that its primary measurement components be specified in the frequency domain. Uniform frequency response measurement components(More)