John Duquette

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A hand-held, high-speed time-domain terahertz (TD-THz) reflection line-scanner for non-destructive examination (NDE) is described. The imager scans a line 150 mm wide and collects a TD-THz cross-sectional “B-scan” of the sub-surface structure at rates up to 15 Hz. By rolling the scanner over a surface, a 2D “C-Scan” image can be(More)
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