John C. Potter

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Today's chips often contain a wealth of embedded instruments and data, including sensors, hardware monitors, built-in self test (BIST) engines, and chip IDs, among others. IEEE P1687 was specifically designed to provide access to such instruments in an efficient manner, and some companies are already implementing the proposed standard on their chips.(More)
1Southern Methodist University, Dallas, TX 2University of St. Thomas, St. Paul, MN 3Brown University, Providence, RI 4SiliconAid, Austin, TX 5ASSET InterTech, Richardson, TX Abstract— We propose an architecture for an FPGA-based tester for a 3D stacked IC. Our design exploits the underlying structure of the FPGA, allowing it to be used to efficiently store(More)
In this paper, we describe the use of manufacturing scan-based vectors to structurally assess the frequency of any given semiconductor design, as opposed to the complex and costly effort of creating a functional set of vectors that can actually exercise all of the functions needed to accurately determine if the chip really operates at its rated or(More)