Learn More
Taylor & Francis makes every effort to ensure the accuracy of all the information (the " Content ") contained in the publications on our platform. However, Taylor & Francis, our agents, and our licensors make no representations or warranties whatsoever as to the accuracy, completeness, or suitability for any purpose of the Content. Any opinions and views(More)
One of the weak points of DEA (Data Envelopment Analysis) models indicated in literature [1,2] is their sensitivity to variable measurement errors. The occurrence of data interference, which is the basis of the productivity analysis, may distort the classification of the units and may cause misjudgement of their effectiveness. In the article the results of(More)
In this paper, we are presenting an approach for electro-thermal management in nanoelectronics devices and systems. We are assuming that at the nanoscale level like at the highest the thermal phenomena are important in the conception of the electronics systems. In addition, an optimal location of the heat sources in nonoscale devices is considered as an(More)
  • 1