Jiun-Lang Huang

Learn More
In this paper, we present a BIST scheme for testing on-chip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measuring the DNL and INL of the converters. We validate the scheme with software simulation—5% LSB (least significant bit) test accuracy can be achieved in the presence of reasonable(More)
In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry.(More)
For two-pattern at-speed scan testing, the excessive power supply noise at the launch cycle may cause the circuit under test to malfunction, leading to yield loss. This paper proposes a new weight assignment scheme for logic switching activity; it enhances the IR-drop assessment capability of the existing weighted switching activity (WSA) model. By(More)
Delta-sigma modulation has become popular in modern analog-to-digital (AD) modulator design due to their relatively high immunity to process variations. In this paper, we propose efficient characterization techniques to obtain the key performance parameters of the 1-bit first-order delta-sigma modulator which is intended to be used as an on-chip analog(More)
—The analog built-in self-test (BIST) scheme, with stimulus generation and response extraction based on the 6-1 modulation, is proven to be quite effective for sampled-data systems. We show that the 6-1 modulators can be selected optimally for certain applications and functional tests. The criteria for valid tests are also derived. In particular, a valid(More)
In this paper, we present a BIST technique that measures the RMS value of a Gaussian distribution period jitter. In the proposed approach, the signal under test is delayed by two different delay values and the probabilities it leads the two delayed signals are measured. The RMS jitter can then be derived from the probabilities and the delay values. Behavior(More)
In this paper we present the specification back-propagation technique which enables one to derive the constraint of an internal functional block with respect to a given DC specification for an analog/mixed-signal system. Based on this technique, we implement an efficient fault simulator which reduces the required efforts by (1) removing undetectable faults(More)
Yield loss caused by excessive power supply noise has become a serious problem in at-speed scan testing. Although <i>X</i>-filling techniques are available to reduce the launch cycle switching activity, their performance may not be satisfactory in the linear-decompressor-based test compression environment. This paper solves this problem by proposing a novel(More)