Jiun-Lang Huang

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In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry.(More)
For two-pattern at-speed scan testing, the excessive power supply noise at the launch cycle may cause the circuit under test to malfunction, leading to yield loss. This paper proposes a new weight assignment scheme for logic switching activity; it enhances the IR-drop assessment capability of the existing weighted switching activity (WSA) model. By(More)
This paper presents a self-testing and calibration method for the embedded successive approximation register (SAR) analog-to-digital converter (ADC). We first propose a low cost design-for-test (DfT) technique which tests a SAR ADC by characterizing its digital-to-analog converter (DAC) capacitor array. Utilizing DAC major carrier transition testing, the(More)
Parallel programming is an attractive solution to accelerate test pattern generation (TPG); however, the associated non-determinism often leads to non-reproducible test pattern sets. In this paper, the circular pipeline processing (CPP) principle is proposed to facilitate deterministic parallel TPG. CPP preserves the task processing orders that are(More)
This paper presents PHS-Fill, an ATPG technique that reduces (1) power supply noise for scan-based at-speed testing, and (2) test data volume in a Huffman coding based test compression environment. PHS-Fill first identifies the preferred Huffman symbols; these symbols correspond to the test pattern templates that improve test compression and reduces power(More)
Broadcast scan test patterns suffer low fault detection efficiency due to the broadcast induced test pattern constraints. This paper presents a test pattern generation technique for broadcast scan that's capable of skew insertion and partial-serial scan — the former alters while the latter partially removes the test pattern constraints due to the(More)