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This paper provides a methodology for estimating the proton and heavy ion static saturation crosssections for multi-bit upsets (MBUs) in Xilinx fieldprogrammable gate arrays (FPGAs) and describes a methodology for determining MBUs’ effects on triplemodular redundancy (TMR) protected circuits. Experimental results are provided.
Using reconfigurable, static random-access memory (SRAM) based field-programmable gate arrays (FPGAs) for spacebased computation has been a very active area of research for the past decade. Because these commercially-available devices are only radiation-tolerant in terms of total ionizing dose and single-event latchup, these devices must be qualified for(More)
Using reconfigurable, static random-access memory (SRAM) based field-programmable gate arrays (FPGAs) for space-based computation has been an exciting area of research for the past decade. In comparison with traditional radiation-hardened electronics, these devices would allow spacecrafts to be more adaptive and responsive to changing mission needs.(More)
Field Programmable Gate Array devices have become the technology of choice in small volume modern instrumentation and control systems. These devices have always offered significant advantages in flexibility, and recent advances in fabrication have greatly increased logic capacity, substantially increasing the number of applications for this technology.(More)
Over the past 15 years many organizations have researched the use of Static-Random Access Memory (SRAM)-based Field-Programmable Gate Arrays (FPGAs) in space. Although the components can provide a performance improvement over radiation-hardened processing components, random soft errors can occur from the naturally occurring space radiation environment. Many(More)