Jih-Jong Wang

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Heavy-ion beam is used to perform Single Event Effects testing on the Flash-based and radiation hardened FPGA, the RT4G150 device. Soft errors due to SEU and SET in the fabric Flip-Flops and PLL generated clocks are measured and analyzed. SEFIs in PLL and SERDES are also observed.
New 65 nm flash-based field programmable gate array with system-on-chip capability is introduced. We present recent Total Ionizing Dose tests results on Smart Fusion 2 Flashbased FPGAs. TID effects at the device and product level are presented and discussed.
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