Jifeng Zou

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Sampling rate required in the N<sup>th</sup> Power Nonlinear Transformation (NPT) method is typically much greater than Nyquist rate, which causes heavy burden for the Analog to Digital Converter (ADC). Taking advantage of the sparse property of PSK signals' spectrum under NPT, we develop the NPT method for PSK signals with Sub-Nyquist rate samples. In this(More)
A finite element analysis (FEA) method used to determine the limits of package failure criteria is described. The failure criteria for the micro-electro-mechanical system (MEMS) packages presented here include von Mises, Mohr's theory, and micro-crack phenomena. In addition, we explore the limits of micro-scale failure criteria on brittle MEMS assemblies.(More)
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