Jiann-Cherng Su

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The combination of Synchrotron White Beam X-ray Topography (SWBXT) and High Resolution Triple Crystal X-ray Diffractometry (HRTXD) has been used to non-destructively diagnose defect structures in single crystals grown in both microgravity and ground-based environments. Due to the fact that SWBXT is the superior technique for the characterization of defects(More)
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