Jian–Zhong Ma

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The statistical properties of the spectrum of the staggered Dirac operator in an SU(2) lattice gauge theory are analyzed both in the bulk of the spectrum and at the spectrum edge. Two commonly used statistics, the number variance and the spectral rigidity, are investigated. While the spectral fluctuations at the edge are suppressed to the same extent as in(More)
Channel hot-electron degradations on strained MOSFETs are examined experimentally. The stressed model parameters are used in SpectreRF simulation to investigate the impact of stress time on dual-band power amplifier and mixer-LNA performances. Electrical stress decreases power-added efficiency of dual-band PA and increases noise figure of integrated(More)
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