Jenna R Tong

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Electron tomography is a powerful technique that can probe the three-dimensional (3-D) structure of materials. Recently, this technique has been successfully applied to inorganic materials using Z-contrast imaging in a scanning transmission electron microscope to image nanomaterials in 3-D with a resolution of 1 nm in all three spatial dimensions. However,(More)
A new algorithm for computing electron microscopy tomograms which combines iterative methods with dual-axis geometry is presented. Initial modelling using test data shows several improvements over both the weighted back-projection and simultaneous iterative reconstruction technique methods, with increased stability and tomogram fidelity under high-noise(More)
Dislocations and their interactions govern the properties of many materials, ranging from work hardening in metals to device pathology in semiconductor laser diodes. However, conventional electron micrographs are simply two-dimensional projections of three-dimensional (3D) structures, and even stereo microscopy cannot reveal the true 3D complexity of defect(More)
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