Jeffrey A. Jargon

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—We describe a stable method for calibrating digital waveforms and eye diagrams by use of the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any associated cables and test fixtures. We demonstrate the effectiveness of the method by performing a(More)
This article describes how artificial neural networks (ANNs) can be used to benefit a number of RF and microwave measurement areas including vector network analysis (VNA). We apply ANNs to model a variety of on-wafer and coaxial VNA calibrations, including open-short-load-thru (OSLT) and line-reflect-match (LRM), and assess the accuracy of the calibrations(More)
—We present a procedure for correcting the timebase distortion (TBD) and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the TBD and jitter sequentially with overlapping measurements and using the information in the overlapping portion to adjust the results. We use eye diagrams to demonstrate the effectiveness of the(More)
We describe an approach for generating artificial neural network (ANN) models for nonlinear devices, based upon frequency-domain data measured using a nonlinear vector network analyzer (NVNA). We demonstrate that these ANN models give accurate descriptions of the input-output relationships of the device over the span of the measurements. We also use the(More)
— We present a method for establishing traceability of a commercial electronic calibration unit for vector network analyzers by characterizing the scattering parameters of its internal states with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Microwave Uncertainty Framework to propagate uncertainties. With the electronic(More)
In this paper, we introduce nonlinear large-signal scattering ( [Formula: see text]) parameters, a new type of frequency-domain mapping that relates incident and reflected signals. We present a general form of nonlinear large-signal [Formula: see text]-parameters and show that they reduce to classic [Formula: see text]-parameters in the absence of(More)
— Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic sampling that can be used to establish a traceable calibration chain between high-speed waveform(More)