Jeffrey A. Jargon

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This article describes how artificial neural networks (ANNs) can be used to benefit a number of RF and microwave measurement areas including vector network analysis (VNA). We apply ANNs to model a variety of on-wafer and coaxial VNA calibrations, including open-short-load-thru (OSLT) and line-reflect-match (LRM), and assess the accuracy of the calibrations(More)
We describe an approach for generating artificial neural network (ANN) models for nonlinear devices, based upon frequency-domain data measured using a nonlinear vector network analyzer (NVNA). We demonstrate that these ANN models give accurate descriptions of the input-output relationships of the device over the span of the measurements. We also use the(More)
We present a procedure for correcting the timebase distortion (TBD) and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the TBD and jitter sequentially with overlapping measurements and using the information in the overlapping portion to adjust the results. We use eye diagrams to demonstrate the effectiveness of the(More)
We describe a stable method for calibrating digital waveforms and eye diagrams by use of the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any associated cables and test fixtures. We demonstrate the effectiveness of the method by performing a(More)
We evaluate the uncertainty in on-wafer vector-calibrated nonlinear measurements with the National Institute of Standards and Technology (NIST) Microwave Uncertainty Framework. We include in our analysis uncertainties in the passive calibration standards, power meter, NIST-traceable phase calibration reference, cable bending, and probe alignment. These(More)
We provide techniques to generate and characterize precision wideband millimeter-wave modulated signals. We use predistortion to obtain a significant improvement in signal quality and an associated reduction in the error vector magnitude (EVM) of the signals generated by an arbitrary-waveform-generator-based source. We adapt a recently developed microwave(More)
Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic sampling that can be used to establish a traceable calibration chain between high-speed waveform(More)
We present a technique to characterize and correct for linear and weakly nonlinear distortion introduced by the nonideal response of a wideband, high-frequency modulated-signal source. The magnitude and phase relationships between frequency components in a measured modulated signal are maintained by use of a calibrated equivalent-time sampling oscilloscope.(More)