Jean-Christophe Toussaint

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Thin film alloys with perpendicular anisotropy were studied using Lorentz transmission electron microscopy (LTEM). This work focuses on the configuration of domain walls and demonstrates the suitability and accuracy of LTEM for the magnetic characterization of perpendicular magnetic anisotropy materials. Thin films of chemically ordered (L1(0)) FePd alloys(More)
—We investigated with XMCD-PEEM magnetic imaging the magnetization reversal processes of Néel caps inside Bloch walls in self-assembled, micron-sized Fe(110) dots with flux-closure magnetic state. In most cases the magnetic-dependent processes are symmetric in field, as expected. However, some dots show pronounced asymmetric behaviors. Micromagnetic(More)
Lorentz Transmission Electron Microscopy (LTEM) allows the observation of magnetization evolution in thin magnetic layers. Electron Microscopy which enables observation at a nanometric scale is sensitive to magnetic induction perpendicular to the beam. Here we show that this technique allows the magnetization process in thin layers having perpendicular(More)
The bottleneck of micromagnetic simulations is the computation of the long-ranged magnetostatic fields. This can be tackled on regular N-node grids with Fast Fourier Transforms in time N log N , whereas the geometrically more versatile finite element methods (FEM) are bounded to N 4/3 in the best case. We report the implementation of a Non-uniform Fast(More)
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