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Reduced pin count testing (RPCT) has proven to be an effective solution to reduce structural test costs in a manufacturing environment. Traditionally, RPCT has focused on stuck-at faults and IO loop-back tests. However, as circuit feature sizes shrink and new technology nodes employed, at-speed tests are becoming critical to assure low defect levels. In(More)
This paper presents an extensive study on evaluating the effects of static alternative fault models (AFM) on product quality in the face of the latest defect screening techniques. The fault models that are presented in this research are multiple-detect stuck-at, static transition fault, and layout-based deterministic bridges. The results show the quality(More)
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