Jan Torben Weinkopf

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Fault emulation has become an important tool for test evaluation. However, until now fault models other than the stuck-at fault model have rarely been used in emulation. In this paper, we propose non-classical fault models for emulation and a generic fault emulation environment capable of supporting these and other fault models and different emulation modes(More)
The fault coverage of tests for microelectronic circuits must be evaluated as part of the test generation process. Although much faster than fault simulation, fault-grading a large and complex design using fault emulation can still take up a considerable amount of time. This is especially true when considering that the whole process has to be repeated when(More)
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