Jan Ten Pierick | Semantic Scholar

Publications
Influence

Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach

C. Feige, Jan Ten Pierick, C. Wouters, R. Tangelder, H. Kerkhoff
Engineering, Computer Science
J. Electron. Test.
1 February 1999

In this paper a concept is proposed to combine a bus-transfer based test approach (AMBA) with the well-known scan-test technique. Expand

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