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Jan Ten Pierick

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Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach

Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff
J. Electronic Testing
1998

In this paper a concept is proposed to combine a bus-transfer based test approach (AMBA) with the well-known scan-test technique. This novel approach combines the advantages of modularity and core… (More)

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