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Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach
- C. Feige, Jan Ten Pierick, C. Wouters, R. Tangelder, H. Kerkhoff
- Engineering, Computer Science
- J. Electron. Test.
- 1 February 1999
In this paper a concept is proposed to combine a bus-transfer based test approach (AMBA) with the well-known scan-test technique. Expand