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Many physical synthesis tools interdigitate signal and power lines to reduce cross-talk, and thus, improve signal integrity and timing predictability. Such approaches are extremely effective at reducing cross-talk at circuit speeds where inductive effects are inconsequential. In this paper, we use a detailed distributed RLC model to show that inductive(More)
In this paper, a layout dependent full-chip electroplating (ECP) topography model is developed based on the additive nature of the physics of the EP process. Two layout attributes: layout density, and feature perimeter sum are used to compute the post-ECP topography. Under a unified mechanism, two output variables representing the final topography: the(More)
Programmable circuit design has played an important role in improving design productivity over the last few decades. By imposing structure on the design, efficient automation of synthesis, placement and routing is possible. We focus on a class of programmable circuits known as mask programmable circuits. In this paper, we describe key issues in design and(More)
—With process technology and functional integration advancing steadily, chips are continuing to grow in area while critical dimensions are shrinking. This has led to the emergence of on-chip inductance to be a factor whose effect on performance and on signal integrity has to be managed by chip designers and has to be sometimes traded off against other(More)
In deep submicron feature sizes continue to shrink aggressively beyond the natural capabilities of the 193 nm lithography used to produce those features thanks to all the innovations in the field of resolution enhancement techniques (RET). With reduced feature sizes and tighter pitches die level variations become an increasingly dominant factor in(More)
In this paper, we develop a generalized automated design methodology for tunable impedance matching networks in reconfigurable wireless systems. The method simultaneously determines the fixed and tunable/switchable circuit element values in an arbitrary-order canonical filter for a general set of performance constraints over a discrete or continuous set of(More)
Since the onset of the 90 nm node the challenges associated with further transistor scaling while maintaining a consistently functional, reliable, and yielding design have increased substantially. While those challenges carry across the spectrum of the manufacturing, the EDA, and the design communities, we believe it is the responsibility and the goal of(More)