James R. Lloyd

Learn More
The magnitude of the negative magnetoresistance (MR) effect found in the low-k dielectric SiCOH is found to decrease with time on electrical bias and temperature stress (BTS). The MR decay fits an exponential function reasonably well such that the time constant of the fit can be used to compare decays due to different BTS conditions. Higher voltages and(More)
A principle effort during the development of any new semiconductor process is that of insuring the inherent reliability of material made with that process. However, despite its importance it continues to be a largely un-standardized process with great variations across the industry. Designing a qualification process comes with the challenge of optimizing(More)
  • 1