James D. Bouford

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
The Major Event Day identification process used in distribution reliability calculation described in IEEE Standard 1366-2003 is based on computing a threshold from the prior five years of daily SAIDI data. Infrequent events, such as a hurricane, severe ice storm, or earthquake can appreciably increase the Major Event Day threshold value. This will usually(More)
  • 1