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—Radiation-induced single event upsets (SEUs) pose a major challenge for the design of memories and logic circuits in high-performance microprocessors in technologies beyond 90nm. Historically, we have considered power-performance-area trade offs. There is a need to include the soft error rate (SER) as another design parameter. In this paper, we present(More)
Electrical power requirements for the next generation of deep space missions cover a wide range from the kilowatt to the milliwatt. Several of these missions call for the development of compact, low weight, long life, rugged power sources capable of delivering a few milliwatts up to a couple of watts while operating in harsh environments. Advanced solid(More)
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