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The bathtub curve is widely used in the reliability world to illustrate three characteristics of the system (or an IC) failure rate curve: the early failure rate during initial phase of life, the intrinsic random constant failure rate in the use life, and the wear-out phase at the end-of-life (Reddy, 2003). The bottom part is usually characterised by a(More)
This paper presents the long-term stability of integrated CMOS resistors in a 40nm technology node. Unsilicided polysilicon and diffusion resistors with two different geometries were investigated. The thermal stability of the resistors was studied at different stress temperatures. Some resistors were subjected to the critical bake temperature in the WLCSP(More)
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