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Optical constants of GaxIn1−xP lattice matched to GaAs
The optical constants of Ga0.51In0.49P have been determined from 0.8 to 5.0 eV using variable‐angle spectroscopic ellipsometry measurements at room temperature. The metal‐organicExpand
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Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications
Variable angle spectroscopic ellipsometry (VASE) is important for metrology in several industries, and is a powerful technique for research on new materials and processes. SophisticatedExpand
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Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry
concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry" We have measured the dielectric function of bulk nitrogen-doped 4H and 6H SiCExpand
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Determination of the mid-IR optical constants of water and lubricants using IR ellipsometry combined with an ATR cell
Abstract The mid-IR bulk optical constants for the lubricants Fomblin, Demnum S200, 2001A and Krytox 16256N, as well as water, are determined by infrared ellipsometric analysis using an AttenuatedExpand
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Optical constants of Ga x In 1- x P lattice matched to GaAs
The optical constants of GaeslInu4sP have been determined from 0.8 to 5.0 eV using variable-angle spectroscopic ellipsometry measurements at room temperature. The metal-organicExpand
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Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry.
Analytic expressions for the eigenvalues for the four-wave components at an oblique angle of light incidence inside a randomly oriented anisotropic magneto-optic dielectric medium are reportedExpand
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Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared
Spectroscopicellipsometry (SE) is a noncontact and nondestructive optical technique for thin film characterization. In the past 10 yr, it has migrated from the research laboratory into theExpand
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Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument.
We report on the development of the first integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument, covering an ultra wide spectral range from 3 cm(-1) to 7000 cm(-1)Expand
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Optical properties of bulk and thin-film SrTiO3 on Si and Pt
We have studied the optical properties (complex dielectric function) of bulk SrTiO3 and thin films on Si and Pt using spectroscopic ellipsometry over a very broad spectral range, starting at 0.03 eVExpand
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Temperature dependence of optical properties of GaAs
Pseudodielectric functions 〈e〉=〈e1〉+i〈e2〉 of GaAs were measured by spectroscopic ellipsometry (SE), in the range of 1.6–4.45 eV, at temperatures from room temperature (RT) to ∼610 °C. A very clean,Expand
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