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Angular Dependence of Single Event Sensitivity in Hardened Flip/Flop Designs
SEU data on 90 nm structures displays a strong dependence on incident angle. A right parallelepiped (RPP) approximation is clearly not applicable to the observed response. This paper presents theExpand
At-Speed SEE Testing of RHBD Embedded SRAMs
We describe a test structure architecture that allows at-speed Single Event Effects (SEE) testing on embedded memory arrays. The at-speed test structure enables identification of Multiple Cell UpsetsExpand
Benchmarking at the Frontier of Hardware Security: Lessons from Logic Locking
This work performs a critical review of logic locking techniques in the literature, and exposes several shortcomings, and devise a community-led benchmarking exercise to address the evaluation deficiencies. Expand
An age-aware library for reliability simulation of digital ICs
A general method for creating an age-aware library of cells, including the impact of multiple reliability degradation mechanisms, is presented. The underlying degradation models take into account keyExpand