Author pages are created from data sourced from our academic publisher partnerships and public sources.
- Publications
- Influence
Building Manycore Processor-to-DRAM Networks with Monolithic Silicon Photonics
- Christopher Batten, A. Joshi, +11 authors K. Asanovic
- Computer Science
- 16th IEEE Symposium on High Performance…
- 26 August 2008
TLDR
Photonic ADC: overcoming the bottleneck of electronic jitter.
- A. Khilo, S. Spector, +24 authors F. Kärtner
- Computer Science, Medicine
- Optics express
- 13 February 2012
TLDR
Comparative study of phonon‐limited mobility of two‐dimensional electrons in strained and unstrained Si metal–oxide–semiconductor field‐effect transistors
- S. Takagi, J. Hoyt, J. Welser, J. Gibbons
- Physics
- 1 August 1996
The phonon‐limited mobility of strained Si metal–oxide–semiconductor field‐effect transistors (MOSFETs) fabricated on a SiGe substrate is investigated through theoretical calculations including… Expand
Building Many-Core Processor-to-DRAM Networks with Monolithic CMOS Silicon Photonics
- Christopher Batten, A. Joshi, +11 authors K. Asanovic
- Computer Science, Materials Science
- IEEE Micro
- 1 July 2009
TLDR
Fabrication and analysis of deep submicron strained-Si n-MOSFET's
- Kern Rim, J. Hoyt, J. Gibbons
- Materials Science
- 1 July 2000
Deep submicron strained-Si n-MOSFETs were fabricated on strained Si/relaxed Si/sub 0.8/Ge/sub 0.2/ heterostructures. Epitaxial layer structures were designed to yield well-matched channel doping… Expand
Continuous MOSFET performance increase with device scaling: The role of strain and channel material innovations
- D. Antoniadis, I. Åberg, C. N. Chléirigh, O. Nayfeh, A. Khaki-Firooz, J. Hoyt
- Engineering, Computer Science
- IBM J. Res. Dev.
- 1 July 2006
TLDR
Strain dependence of the performance enhancement in strained-Si n-MOSFETs
- J. Welser, J. Hoyt, S. Takagi, J. Gibbons
- Materials Science
- Proceedings of IEEE International Electron…
- 11 December 1994
The first measurements of the strain dependence of the electron mobility enhancement in n-MOSFETs employing tensilely-strained Si channels are reported. For pseudomorphic Si films grown on… Expand
Engineering the Electron–Hole Bilayer Tunneling Field-Effect Transistor
- S. Agarwal, J. Teherani, J. Hoyt, D. Antoniadis, E. Yablonovitch
- Engineering, Materials Science
- IEEE Transactions on Electron Devices
- 1 April 2014
The electron-hole (EH) bilayer tunneling field-effect transistor promises to eliminate heavy-doping band tails enabling a smaller subthreshold swing voltage. Nevertheless, the electrostatics of a… Expand
Comparison of arsenic and phosphorus diffusion behavior in silicon-germanium alloys
- S. Eguchi, J. Hoyt, C. Leitz, E. Fitzgerald
- Chemistry
- 4 March 2002
The diffusion behavior of ion-implanted arsenic and phosphorus in relaxed Si0.8Ge0.2 has been investigated. Under equilibrium, extrinsic conditions, both dopants are observed to diffuse faster in… Expand
Silicon photonics for compact, energy-efficient interconnects [Invited]
- T. Barwicz, H. Byun, +17 authors J. Yoon
- Computer Science
- 2007
TLDR