J.Y. Lee

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
Distributed self-diagnosis has long been proposed to efficiently test multiprocessor and array based systems. Such an approach is also now being considered for testing integrated circuit wafers containing identical circuits. Here the testing is based on a majority voting on the test results from neighboring nodes. The authors identify that the voting for(More)
  • 1