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  • Tom Wirtz, Patrick Philipp, J-N Audinot, D Dowsett, Santhana Eswara
  • Materials Science, Medicine
  • Nanotechnology
  • 2015 (First Publication: 30 October 2015)
  • Secondary ion mass spectrometry (SIMS) constitutes an extremely sensitive technique for imaging surfaces in 2D and 3D. Apart from its excellent sensitivity and high lateral resolution (50 nm onContinue Reading