J. F. Tarillo

We don’t have enough information about this author to calculate their statistics. If you think this is an error let us know.
Learn More
Technology evolution provides ever increasing density of transistors in chips, lower power consumption and higher performance. In this environment the occurrence of multiple-bit upsets (MBUs) becomes a significant concern. Critical applications need high reliability, but traditional error mitigation techniques assume only the single error model, and only a(More)
  • 1