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—Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact on the yield of the integrated circuits and need to be considered early in the design flow. Traditional corner based deterministic methods are no longer effective and circuit optimization(More)
  • Mangesh B Kondalkar, Arunkumar P Chavan, +9 authors M. Pedram
  • 2013
A fault tolerant adder implemented using Kogge-stone configuration can correct the error due to inherent redundancy in the carry tree but no error detection is possible. This proposed design is based on fault tolerant adder [1] that uses Sparse kogge-stone adder that is capable of both fault detection and correction. Fault tolerance is achieved by using two(More)
Publications at this site are occasionally revised, please check for the latest version under the same title. Abstract { OpenExperiment is a user-conngurable open environment that supports collaborative experimental design and execution on the Internet. The environment is created with few simple conngurations of a generic client. The platform-speciic(More)
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