J. C. Roberts

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GaN devices exhibit excellent potential for use in many RF applications. However, commercial acceptance of the technology has been hindered by the scarcity and non-statistical nature of reliability results. In this work we present a full device level reliability study of GaN-on-Si HFETs. Reliability results on this technology include three-temperature DC(More)
Six studies regarding forgiveness are presented. The Heartland Forgiveness Scale (HFS), a self-report measure of dispositional forgiveness (with subscales to assess forgiveness of self, others, and situations) was developed and demonstrated good psychometric properties. Forgiveness correlated positively with cognitive flexibility, positive affect, and(More)
Six studies regarding forgiveness are presented. The Heartland Forgiveness Scale (HFS), a self-report measure of disposition-al forgiveness (with subscales to assess forgiveness of self, others, and situations) was developed and demonstrated good psychometric properties. Forgiveness correlated positively with cognitive flexibility, positive affect, and(More)
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