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Journals and Conferences
We present statistical techniques for evaluating random and systematic errors for use in flight performance predictions for large flight lots and ultra-high reliability applications.
We construct a Bayesian risk metric with a method that allows for efficient and systematic use of all relevant information and provides a rational basis for RHA decisions in terms of costs and… (More)
A dozen linear bipolar microcircuits were first irradiated with neutrons then gammas and compared to the same devices exposed to gammas only. The data show that neutron irradiation can affect… (More)
We investigate model dependence of bounding estimates of TID degradation as a function of sample size and statistical model and develop a method for selecting the model with greatest predictive power.
Thirty discrete heterojunction bipolar transistors fabricated in IBM's SiGe 7HP process were irradiated at dose rates of 0.013 rad(Si)/s, 0.11 rad(Si)/s and 171 rad(Si)/s to determine their… (More)
Optocouplers from two different suppliers were subjected to proton, neutron, and gamma irradiations. A simple transistor model was used to compare degradation in current transfer ratio (CTR) from the… (More)