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This paper presents an I test generation system for DDQ scan-based circuits, called CURRENT. A library-based fault modeling strategy is used to specify a realistic target fault set, which encompasses intra-gate shorts (for example stuck-on faults, gate-drain shorts) as well as inter-gate shorts (bridging faults). CURRENT consists of a fault simulator and a(More)
COMSIM is a fault simulator for combinational circuits which can efficiently handle various gate level fault models. Stuck-at faults, function conversions, bridging faults, transition faults as well as multiple faults of all types and faults with additional fault detection conditions, can be simulated in one pass. This offers a practical approach to solve(More)
This paper describes a two-stage method to generate test sets for I testing and to determine the leakage DDQ fault coverage for given test pattern sets. The method has been integrated within a fault simulator. Furthermore, it will be proved that any complete test pattern set generated for stuck-at faults detects all leakage faults caused by intra-gate(More)