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COMSIM is a fault simulator for combinational circuits which can efficiently handle various gate level fault models. Stuck-at faults, function conversions, bridging faults, transition faults as well as multiple faults of all types and faults with additional fault detection conditions, can be simulated in one pass. This offers a practical approach to solve(More)
This paper presents an I test generation system for DDQ scan-based circuits, called CURRENT. A library-based fault modeling strategy is used to specify a realistic target fault set, which encompasses intra-gate shorts (for example stuck-on faults, gate-drain shorts) as well as inter-gate shorts (bridging faults). CURRENT consists of a fault simulator and a(More)