Ivica Stevanovic

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" Forward-looking fault simulation for improved static compaction, " IEEE Trans. Comput.-Aided Design Integr. On static test com-paction and test pattern ordering for scan designs, " in Proc. Test vector decomposition-based static compaction algorithms for combinational circuits, " ACM Trans. Des. An experimental chip to evaluate test techniques experiment(More)
Ionic wind devices or electrostatic fluid accelerators are becoming of increasing interest as tools for thermal management, in particular for semiconductor devices. In this work, we present a numerical model for predicting the performance of such devices; its main benefit is the ability to accurately predict the amount of charge injected from the corona(More)
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— The " lumped charge " power diode compact model [1] is extended including impact ionization while maintaining the low computational cost. The new model can better reproduce the shape of the current peak during reverse recovery, allowing for more predictive EMI/EMC simulations. The parameter extraction procedure is also improved and automated through(More)
In our paper [1], there was a typo in (1), and (10) and (11) were incorrect if there is more than one forward propagation of variance (FPV) variable. In the following, we give the correct expressions for these three equations: e i (p) ≈ e i (¯ p) + N j=1 s i,j (p j − ¯ p j) + N j,k=1 s i,jk (p j − ¯ p j)(p k − ¯ p k) (1) σ 2 e i
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