Ingeborg E. Beckers

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PURPOSE Measurement of intra-retinal layer thickness using optical coherence tomography (OCT) has become increasingly prominent in multiple sclerosis (MS) research. Nevertheless, the approaches used for determining the mean layer thicknesses vary greatly. Insufficient data exist on the reliability of different thickness estimates, which is crucial for their(More)
Appropriate PSF engineering in microscopy can be used to increase resolution [1], reduce aberrations [2] or to extend the depth-of-field (DOF) [3,4,5]. This study concentrates on PSF engineering in EDF microscopy. Most extended DOF techniques require image restoration by e.g. regularized filtering to achieve high lateral resolution and extended DOF(More)
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