Indrajit De

  • Citations Per Year
Learn More
Assessing quality of distorted/decompressed images without reference to the original image is difficult due to vagueness in extracted features and complex relation between features and visual quality of images. The paper aims at assessing the quality of distorted/decompressed images without any reference to the original image by developing an adaptive(More)
Assessing quality of distorted/decompressed images without reference to the original image is a challenging task because extracted features are often inexact and no predefined relation exists between features and visual quality of images. The paper aims at assessing quality of distorted/ decompressed images without any reference to the original image by(More)
Assessing quality of distorted/decompressed images without reference to the original image is a challenging task because extracted features are often inexact and there exist complex relation between features and visual quality of images. The paper aims at assessing quality of distorted/decompressed images without any reference to the original image by(More)
Assessing quality of distorted/decompressed images without reference to the original image is difficult because extracted features are not exact and complex relationship exists between image features and its visual quality. The paper aims at assessing the quality of distorted/decompressed images without any reference to the original image by developing a(More)
Electron beam inspection has been commonly used in the semiconductor fabrication process to inspect wafers for defective metal or polysilicon plugs, plugs that fail to make an electrical contact to the underlying circuitry. Recently, there has been interest in using electron beams to inspect plugs that are not necessarily electrically floating but have a(More)
  • 1