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In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a pro-grammable Johnson counter and is called folding counter. Both the theoretical background and practical algorithms are presented to characterize a set of deter-ministic test cubes by a reasonably(More)
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional compression scheme, which combines the advantages of known vertical and horizontal compression techniques. To reduce both the number of patterns to be stored and the number of bits(More)