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  • Haihua Liu, X. F. Duan, Xiangdong Qi, Qiaoling Xu, Hsby Li, Haijie Qian
  • Physics
  • 2006 (First Published: 26 June 2006)
  • In this letter we report the characterization of local compressive strain in p-type strained-silicon channel metal-oxide-semiconductor field effect transistors by large angle convergent-beam electronContinue Reading