Horst Schleifer

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A novel dynamic latched comparator with reduced kickback noise for high-speed ADCs is presented. Dynamic latched comparators suffer from kickback noise. Especially the common-mode kickback noise becomes even more critical in applications with asymmetric input. By using common source input transistors and a decoupling mechanism the novel dynamic latched(More)
The Field Soft Error Rate (FSER) has been determined by the Variation of the critical Charge and the measurement of the Charge collection volume determined by alpha-particle irradiation. The modelled FSER versus critical Charge dependence agrees well to the one of the Field Soft Error measurements. The results futher Show, that the irnpact of the on-chip(More)
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