Hong-Ha Vuong

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The first paper reports on a major characterization and modeling effort for the process variability. It presents the design and measurements from a large test-structure which provides both within-die and across-die variations. It measures the variability for MOS transistors of varying sizes and the interconnect RC variations. In analyzing this data, the(More)
With the scaling of CMOS technology the design of Electro-Static Discharge (ESD) protection circuits is becoming an increasingly challenging task. This challenge is mainly due to thinner gate oxide, shorter channel length, and shallower junctions. In addition, higher operational frequencies necessitate lower parasitic capacitance ESD protection circuits(More)
The increasing demand for low cost, high performance, highly-integrated solution for RF mobile communication products and the time-to-market pressure have made the design cycle much shorter. It becomes a challenge to predict noise accurately at the early stages of a top down design. In digital circuits, noise can cause the circuit to switch incorrectly and(More)
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