Hong-Ha Vuong

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With the scaling of CMOS technology the design of Electro-Static Discharge (ESD) protection circuits is becoming an increasingly challenging task. This challenge is mainly due to thinner gate oxide, shorter channel length, and shallower junctions. In addition, higher operational frequencies necessitate lower parasitic capacitance ESD protection circuits(More)
The increased process variation has become a significant issue in advanced technology nodes with continuous device scaling. Characterization of the process variability is crucial for circuit designers to understand the technology and achieve high yield products. The first paper reports on a major characterization and modeling effort for the process(More)
The increasing demand for low cost, high performance, highly-integrated solution for RF mobile communication products and the time-to-market pressure have made the design cycle much shorter. It becomes a challenge to predict noise accurately at the early stages of a top down design. In digital circuits, noise can cause the circuit to switch incorrectly and(More)
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