Hiroshi Hamori

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In inspections of printed circuit boards (PCBs), a test probe has to be moved to a number of PCB wiring patterns in some order. This paper considers path optimization for minimizing a total path length of testing PCBs arrayed on a plane. Due to the miniaturization of PCBs, the procedure of “alignment” has been recently needed in order to know the exact(More)
This paper proposes a novel approach for inspection of open/short defects on thin film transistor (TFT) lines of flat panel displays (FPD). The inspection is performed on digitized waveform data of voltage signals that are captured by a capacitor based non-contact sensor by scanning over TFT lines on the surface of mother glass of FPD. The sudden deep falls(More)
This paper proposes a neural network-based approach for the inspection of electrical defects on thin film transistor lines of flat panel displays. The inspection is performed on digitized waveform data of voltage signals that are captured by a capacitor-based non-contact sensor by scanning over thin film transistor lines on the surface of the mother glass(More)
This paper proposes an evolutionary optimized recurrent neural network for inspection of open/short defects on thin film transistor (TFT) lines of flat panel displays (FPD). The inspection is performed on digitized waveform data of voltage signals that are captured by a capacitor based non-contact sensor through scanning over TFT lines on the surface of(More)
Pin probe inspection methods have been widely used in printed circuit board electrical inspection. Due to the miniaturization of electronic devices, the positioning of inspection jig (called probe jig) is very important for precisely conducting pattern tests of wiring on PCBs. This article newly develops a probe jig position correction algorithm that(More)
This paper considers an optimization problem that is to minimize a total path length for inspecting all the wiring patterns of printed circuit boards arrayed on a plane. It is shown that the problem is formulated as a generalized pickup and delivery traveling salesman problem or generalized traveling salesman problem with pickup and delivery, which is a(More)
This paper presents a methodology for optimization of line scan path on fixed panel displays (FPD) using a modified self organizing map (SOM). The existing scanning method of defective thin film transistor (TFT) lines on FPDs by a non-contact moving sensor is top down and unidirectional which is time consuming. First, the problem is approximated to a well(More)
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