Hiromi Inada

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Aberration correction has embarked on a new frontier in electron microscopy by overcoming the limitations of conventional round lenses, providing sub-angstrom-sized probes. However, improvement of spatial resolution using aberration correction so far has been limited to the use of transmitted electrons both in scanning and stationary mode, with an(More)
We examined the effects of the thickness of the Pt shell, lattice mismatch, and particle size on specific and mass activities from the changes in effective surface area and activity for oxygen reduction induced by stepwise Pt-monolayer depositions on Pd and Pd(3)Co nanoparticles. The core-shell structure was characterized at the atomic level using(More)
We report detailed investigation of high-resolution imaging using secondary electrons (SE) with a sub-nanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE(More)
A dedicated analytical scanning transmission electron microscope (STEM) with dual energy dispersive spectroscopy (EDS) detectors has been designed for complementary high performance imaging as well as high sensitivity elemental analysis and mapping of biological structures. The performance of this new design, based on a Hitachi HD-2300A model, was evaluated(More)
Unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been(More)
We report the performance of the first aberration-corrected scanning transmission electron microscope (STEM) manufactured by Hitachi. We describe its unique features and versatile capabilities in atomic-scale characterization and its applications in materials research. We also discuss contrast variation of the STEM images obtained from different annular(More)
The model HD-2700 [1] 200 kV spherical aberration (Cs) corrected dedicated Scanning Transmission Electron Microscope (STEM) has been used for analyzing nanoto subnano-area targets in the fields of nanoscience and nanotechnology with Energy Dispersive X-ray spectrometry (EDX). The Cs corrector [2] enables the formation of sub-nanometer probe size with(More)
INTRODUCTION AS VLSI (very large scale integration) technology evolves toward ever smaller features and multilayer designs, analysis and control of structures and compositions at the atomic level is becoming increasingly important. In 1998 Hitachi HighTechnologies Corporation released the HD-2000, a STEM (scanning transmission electron microscope) that was(More)
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