Hidehiro Takata

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Many of us in the field of ultra-low-<i>V</i><sub><i>dd</i></sub> processors experience difficulty in assessing the sub/near threshold circuit techniques proposed by earlier papers. This paper investigates five major pitfalls which are often not appreciated by researchers when claiming that their circuits outperform others by working at a lower(More)
Error Detection FFs for Dynamic Voltage Scaling (DVS) has been proposed. This technique controls the clock phase based on the timing slack, and reduces the energy consumption by 19.8% compared to non-DVS. The error signal latency is shortened to 6.3%, the area and power penalties for delay buffers on short paths become 35.0% and 40.6% lower compared to the(More)
MPEG-2 decoding and encoding are important applications for multimedia systems. Real-time capability and low-cost implementation are the main design considerations for these systems. Due to the high computational requirements of real-time applications, multimedia systems typically use special-purpose processors to handle data. However, due to the inherent(More)
For Dynamic Voltage Scaling (DVS), we propose a novel design methodology. This methodology is composed of an error detection circuit and three technologies to reduce the area and power penalties which are the large issues for the conventional DVS with error detection. The proposed circuit, Phase-Adjustable Error Detection Flip-Flip (PEDFF), adjusts the(More)
Temperature dependence of 256 within-die random gate delay variations in sub-threshold logic circuits is measured in 40-nm CMOS test chips. When the temperature is reduced from 25◦C to −40◦C, the sigma/average (σ/μ) of the gate delay at 0.3 V increases by 1.4 times. A newly developed model shows that σ/μ of the gate delay is proportional to 1/T for the(More)
A direct power injection (DPI) method evaluates the immunity of a static random access memory (SRAM) core in a 90 nm CMOS technology, with on-die diagnosis structures of memory built-in self test (MBIST) and on-chip voltage waveform monitoring (OCM). The magnitude of sinusoidal voltage variation introduced by DPI is quantified by OCM. The number of(More)