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Test data modification based on test relaxation and X-filling is the preferable approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop(More)
Many studies have been conducted on supporting communication in home and office spaces, but relatively few studies have explored supporting communication in large-scale public spaces, despite the importance of such environments in our daily lives. We propose a transcendent means of communication as an emerging style in this pervasive computing era: a system(More)
We are researching about an age and gender esrinnrion based on wrinkle rerlure and color of facio1 imriges. Preliminary quesrionnaire (enyuere) examination hou ejfectively the facial imoges could br usedfor gender and age estinmtions was executed by using 300 different faces and 21 examinees. Wrinkles appeured in rhe face and rhe shripe and size of(More)
Reducing IR-drop in the test cycle during at-speed scan testing has become mandatory for avoiding test-induced yield loss. An efficient approach for this purpose is post-ATPG test modification based on <i>X</i>-identification and <i>X</i>-filling since it causes no circuit/clock design change and no test vector count inflation. However, applying this(More)