Heon C. Kim

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This paper presents a technique of re-using DFT logic for system functional and silicon debugging. By re-configwing the existing DFT logic implemented on an ASIC, we are able to 1) test each part of an ASIC in a system environment separately and thus locate manufacturing defects, 2) control and observe any state elements of an ASIC to facilitate system(More)
This paper presents a Built-In Self Test (BIST) implementation for external memories like DDR (Double Data Rate), double DDR, QDR (Quad Data Rate) SRAM, DDR FCRAM (Fast Cycle RAM), and RLDRAM (Reduced Latency DRAM). We utilize the memory controller in the functional block to design the BIST so that the BIST design can be simplified and executed at the(More)
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