Heon C. Kim

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This paper presents a Built-In Self Test (BIST) implementation for external memories like DDR (Double Data Rate), double DDR, QDR (Quad Data Rate) SRAM, DDR FCRAM (Fast Cycle RAM), and RLDRAM (Reduced Latency DRAM). We utilize the memory controller in the functional block to design the BIST so that the BIST design can be simplified and executed at the(More)
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